| Original language | English |
|---|---|
| Pages (from-to) | 340-350 |
| Number of pages | 11 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4129 |
| DOIs | |
| State | Published - 2000 |
| Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Keywords
- Conductivity Imaging
- EM
- Multi-Frequency
- Subsurface